By Ashok Goel
than sixty five percentage of the delays at the built-in circuit chip ensue within the interconnections and never within the transistors at the chip. Mathematical concepts to version the parasitic capacitances, inductances, propagation delays, crosstalk noise, and electromigration-induced failure linked to the interconnections within the real looking high-density surroundings on a chip may be mentioned. A One-Semester direction in Modeling of VLSI Interconnections additionally contains an summary of the longer term interconnection applied sciences for the nanotechnology circuits.
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